Failure analysis depends on well-prepared samples, and preparation is often the bottleneck. High-value FIB and SEM systems should spend their time on imaging and analysis, not on tasks a laser can handle faster.

microPREP® PRO and microPREP® PRO FEMTO are dedicated systems for laser-based sample preparation. Both accelerate preparation for failure analysis methods, including TEM, SEM, APT, xCT, XRM, and micromechanical testing. As stand-alone laser tools, they can feed multiple ion-beam-milling and analysis tools simultaneously, so one system keeps several instruments productive.

microPREP® PRO uses a picosecond laser. microPREP® PRO FEMTO uses a femtosecond laser and extends this capability to challenging materials, including brittle, transparent, and stacked materials, as well as ceramics and polymers.

Both systems draw on almost 25 years of laser expertise. They have been field-proven for more than ten years and are continuously enhanced with user feedback, so they reflect the practical requirements of laboratory workflows.

Free your FIB/SEM for what it does best. Speed up your time-to-sample with laser-based sample preparation with microPREP® PRO or microPREP® PRO FEMTO.