Instrument Systems GmbH
About us
Instrument Systems GmbH, founded in Munich in 1986, develops high-precision light metrology solutions for displays, MicroLED wafers, VCSEL/laser diodes, optical interconnects, automotive lighting and LED/SSL modules. Our measurement systems combine spectroradiometers, 2D imaging cameras, integrating spheres and goniometers to provide accurate and traceable optical measurements from UV to IR.
At the core of our portfolio are the high-accuracy CAS series spectroradiometers, widely used as reference instruments for spectral and colorimetric measurements. Our solutions support customers in both R&D and production quality control, with measurements traceable to PTB or NIST.
The Optronik Line products for automotive and traffic applications are developed and marketed at our Berlin facility. Instrument Systems has been a subsidiary of the Konica Minolta Group since 2012. We are actively involved in DIN, CIE and ICDM standardization and cooperate closely with leading metrology institutes. As a member of the MicroLED Industry Association (MIA), we support the development of MicroLED technologies.
Address
Kastenbauerstr. 2
81677 Munich
Germany
E-mail: info@instrumentsystems.com
Phone: +49 89 454943-0
Internet: www.instrumentsystems.com
101 Williams Dr
07446 Ramsey
United States
Phone: +1 888 473-2656
Internet: sensing.konicaminolta.us/us
Contact person:
Justin Blanke
International Sales Manager
E-mail: blanke@instrumentsystems.com
Phone: +49 89 454943-0
Products & Services
Optical Measurement Solutions for Photonics and Optical Interconnects
Instrument Systems provides optical measurement solutions for lasers, VCSELs, microLEDs and other light sources. Our portfolio supports applications ranging from infrared (IR) emitter characterization to the testing of light sources for optical interconnects, including co-packaged optics (CPO) and near-packaged optics (NPO).
Our measurement systems combine spectroradiometry, spatially resolved imaging, near-field and far-field analysis to characterize optical power, wavelength, polarization, beam characteristics and emitter uniformity. The VTC 4000 enables near-field characterization of individual emitters in VCSEL arrays, while the VTC 2400 measures far-field radiation patterns. CAS spectroradiometers combined with ISP integrating spheres support spectral and radiant power measurements. The LumiTop M150 imaging system with microscopic optics enables spatially resolved characterization of microLED arrays.
From device development and laboratory measurements to production testing and automated wafer-level inspection, Instrument Systems offers measurement solutions that help manufacturers identify emitter-level variations, evaluate optical performance and optimize manufacturing processes.
VTC 2400 – Far-field analysis of VCSEL arrays and IR emitters
• Single-shot 2D far-field characterization of VCSEL arrays and IR emitters
• Measure the irradiance, radiant intensity and numerical aperture of the whole emitter ensemble
• Uniformity control of the radiation pattern
• Identification of highest intensity spot needed for laser safety evaluations
• Characterization of beam properties relevant to optical coupling in CPO/NPO applications
• Radiometric calibration traceable to the PTB
VTC 4000 – 2D near-field analysis of VCSEL arrays
• 2D measurement solution for near field characterization of VCSEL arrays
• Radiant power, polarization, position, divergence and peak wavelength for all single emitters
• Flat-field and absolute power calibration, traceable to national metrology standards
• Detection of emitter-level variations and array non-uniformity relevant to CPO/NPO applications
LumiTop M150 – High-resolution microLED array characterization
• 151 MP imaging colorimeter with interchangeable microscope optics for microLED characterization
• Spatially resolved measurement of emitter luminance, chromaticity, size and position.
• Simultaneous RGB imaging and CAS 140D spectral referencing for reliable colorimetric analysis
• Evaluation of emitter uniformity and defects in microLED arrays for display, wafer-level and emerging CPO/NPO applications
IR Measurement System – Modular testing solutions for IR emitters
• Modular measurement solutions for IR LEDs, laser diodes, VCSELs and other infrared emitters
• Spectral characterization with CAS spectroradiometers and application-specific measurement accessories
• Radiant power measurements, with optional pulsed measurement and LIV testing capabilities
• Configurable setups for laboratory characterization, quality control and automated production testing
VCSEL Measurement – High-resolution spectral and radiant power characterization
• High-resolution spectral characterization of laser diodes and VCSELs (down to 0.12 nm)
• Radiant power measurements using CAS spectroradiometers with ISP integrating spheres
• Optional pulse waveform characterization with an integrated photodiode
• Characterization of wavelength and optical output for VCSEL development and CPO/NPO applications
