piezosystem jena
Booth number: 4205-16
www.piezosystem.com
About us
Established in 1991, piezosystem jena offers piezo micro-positioning, piezo nanopositioning and metrology solutions to the semiconductor, aerospace, microscopy and synchrotron community. We have an extensive knowledge and in-depth technical expertise in the application of piezo technology for nanopositioning tasks, and in the design of piezo flexure stages and development of piezomechanical systems.
The strength of piezosystem jena comes from our commitment to complete customer satisfaction in the markets we serve. The partnerships we form with our clientele in applications such as super resolution microscopy, AFM, process control, semiconductor metrology and nanopositioning for synchrotron radiation are long-lasting and mutually beneficial. Our knowledge in piezo technology comes from our own research, and our daily interactions as consultants.
Address
1 Cabot Road, Suite 240
01749 Hudson
USA
Phone: +1 508 8167518
1 Cabot Road, Suite 240
01749 Hudson
USA
E-mail: contact@psj-usa.com
Phone: +1 508 6346688
Internet: www.piezosystem.com
Contact person:
Yuri Toegemann
Lead Application Engineer
E-mail: ytoegemann@piezojena.com
Phone: +1 508 634-6688
Products & Services
Established in 1991, piezosystem jena offers piezo micro-positioning, piezo nanopositioning and metrology solutions to the semiconductor, aerospace, microscopy and synchrotron communities. We have an extensive knowledge and in-depth technical expertise in the application of piezo technology for nanopositioning tasks, and in the design of piezo flexure stages and development of piezo-mechanical systems.We offer: Piezo actuators, stages and many other precision positioning components such as optical objective positioners, optical fiber switches, wafer handling stages, tip-tilt stages and many other related OEM components.
MIPOS Optical Objective Positioners
This z-axis actuating system for precise lens objective positioning is made for applications such as single photon microscopy, semiconductor manufacturing, laser scanning microscopy, and confocal microscopy.